Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces by Gerd Kaupp English | 4 Aug. 2006 | ISBN: 3540284052 | 308 Pages | PDF | 17 MB
"Atomic Force Microscopy: Imaging, Measuring and Manipulating Surfaces at the Atomic Scale" ed. by Victor Bellitto InTeOpP | 2012 | ISBN: 9535104144 9789535104148 | 267 pages | PDF | 21 MB
This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields.